Field emission characteristics of multiwalled carbon nanotubes grown at low temperatures using electron cyclotron resonance chemical vapor deposition

Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures

Volumn 21, Issue 4, 2003, Pages 1660-1664

  Woo, Yun Sung ^a   Jeon, Duk Young ^a   Han, In Taek ^b   Park, Young Jun ^b   Kim, Ha Jin ^b   Jung, Jae Eun ^b   Kim, Jong Min ^b   Lee, Nae Sung ^c  

^a Korea Advanced Institute of Science and Technology (KAIST)   (South Korea)

^b Samsung Advanced Institute of Technology (SAIT)   (South Korea)

^c Sejong University   (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

CHEMICAL VAPOR DEPOSITION; CURRENT DENSITY; ELECTRIC FIELDS; ELECTRON CYCLOTRON RESONANCE; HIGH RESOLUTION ELECTRON MICROSCOPY; ION BOMBARDMENT; TRANSMISSION ELECTRON MICROSCOPY;

MULTIWALLED CARBON NANOTUBES (MWCNT);

CARBON NANOTUBES;

EID: 0141681157     PISSN: 10711023     EISSN: None     Source Type: Journal    
DOI: 10.1116/1.1580116     Document Type: Conference Paper

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