Improved Defect Detection Using Support Vector Machines and Wavelet Feature Extraction Based on Vector Quantization and SVD Techniques

Proceedings of the International Joint Conference on Neural Networks

Volumn 3, Issue , 2003, Pages 2322-2327

  Karras, D A ^a  

^a UNIVERSITY OF HERTFORDSHIRE   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

DEFECTS; IMAGING TECHNIQUES; MULTILAYER NEURAL NETWORKS; VECTOR QUANTIZATION; WAVELET TRANSFORMS;

SINGULAR VALUE DECOMPOSITION (SVD);

FEATURE EXTRACTION;

EID: 0141633872     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (12)

1. Meyer, Y. "Wavelets: Algorithms and Applications", Philadelphia: SIAM, 1993
2. Kolaczyk, E. "WVD Solution of Inverse Problems", Doctoral Dissertation, Stanford University, Dept. of Statistics, 1994
3. Lee, C. S., et. al, "Feature Extraction Algorithm based on Adaptive Wavelet Packet for Surface Defect Classification", to be presented in ICIP 96, 16-19 Sept. 1996, Lausanne, Switzerland.
4. Haykin, S. "Neural Networks, A comprehensive foundation", Prentice Hall, Second edition, 1999.
5. Porter, R. and Canagarajah, N. "A Robust Automatic Clustering Scheme foe Image Segmentation Using Wavelets", IEEE Trans. on Image Processing, April 1996, Vol. 5, No. 4, pp.662 - 665.
6. Unser, M. "Texture Classification and Segmentation Using Wavelet Frames", IEEE trans. Image Processing, Vol. 4, No. 11, pp. 1549-1560, 1995
7. Ryan, T. W., Sanders, D., Fisher, H. D. and Iverson, A. E. "Image Compression by Texture Modeling in the Wavelet Domain", IEEE trans. Image Processing, Vol. 5, No. 1, pp. 26-36, 1996.
8. Antonini, M., Barlaud, M., Mathieu, P. and Daubechies, I. "Image Coding Using Wavelet Transform", IEEE trans. Image Processing, Vol.1, pp. 205-220, 1992.
9. Donoho, D. L. and Johnstone, I. M. "Ideal Time-Frequency Denoising." Technical Report, Dept. of Statistics, Stanford University.
10. W. J. Jasper, S. J. Garnier, H. Potlapalli, "Texture characterization and defect detection using adaptive wavelets", Optical Engineering, Vol. 35, Iss. 11, pp. 3140-3149, November 1996.
11. C.S. Lee-CS, C.H. Choi, J.Y. Choi and S.H Choi, "Surface defect inspection of cold rolled strips with features based on adaptive wavelet packets", IEICE Trans. Inf. Syst, Vol. E80D, Iss. 5, pp. 594-604, 1997.
12. Nam-Deuk Kim and Satish Upda, "Texture classification using rotated wavelet filters", IEEE Trans. SMC-Part A., Vol. 30, Iss. 6, pp. 847-852, 2000.