|
Volumn 5038 I, Issue , 2003, Pages 559-567
|
Scattered poetry as a practical in situ metrology technology
a a |
Author keywords
Inverse scattering; Scatterometry; Silicon material properties
|
Indexed keywords
ALGORITHMS;
GRADIENT METHODS;
INVERSE PROBLEMS;
LIGHT MEASUREMENT;
LIGHT SCATTERING;
MATRIX ALGEBRA;
SEMICONDUCTING SILICON;
HESSIAN MATRIX INVERSION;
INVERSE SCATTERING ALGORITHM;
SCATTEROMETRY;
PHOTOLITHOGRAPHY;
|
EID: 0141611985
PISSN: 0277786X
EISSN: None
Source Type: Conference Proceeding
DOI: 10.1117/12.488480 Document Type: Conference Paper |
Times cited : (7)
|
References (6)
|