Automated Evaluation of Kikuchi Patterns by Means of Radon and Fast Fourier Transformation, and Verification by an Artificial Neural Network

Advanced Engineering Materials

Volumn 5, Issue 8, 2003, Pages 601-606

  Schwarzer, Robert A ^a   Sukkau, Johann ^a,b  

^a CLAUSTHAL UNIVERSITY OF TECHNOLOGY   (Germany)

^b SIEMENS AG   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTAL ORIENTATION; CRYSTAL STRUCTURE; ELECTROMAGNETIC WAVE DIFFRACTION; FAST FOURIER TRANSFORMS; NEURAL NETWORKS; RADON; RESIDUAL STRESSES; SCANNING ELECTRON MICROSCOPY; TRANSMISSION ELECTRON MICROSCOPY;

KIKUCHI PATTERNS;

POLYCRYSTALLINE MATERIALS;

EID: 0141607760     PISSN: 14381656     EISSN: None     Source Type: Journal    
DOI: 10.1002/adem.200300374     Document Type: Article

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