Electrostatic discharge in semiconductor devices: an overview

Proceedings of the IEEE

Volumn 86, Issue 2, 1998, Pages 399-418

  Vinson, James E ^a,b   Liou, Juin J ^c,d  

^a INTERSIL CORPORATION   (United States)

^b UNIVERSITY OF CENTRAL FLORIDA   (United States)

^c Reliability Group   (Netherlands)

^d Microelectronic Reliability   (United States)

Author keywords

Electrical overstress; Electrostatic discharge; Empirical models; Failure mechanisms; Semiconductor devices

Indexed keywords

CHARGE TRANSFER; ELECTRIC CONDUCTIVITY OF SOLIDS; ELECTROSTATICS; INTEGRATED CIRCUITS; SEMICONDUCTOR DEVICES;

ELECTROSTATIC DISCHARGES (ESD);

ELECTRIC DISCHARGES;

EID: 0032002444     PISSN: 00189219     EISSN: None     Source Type: Journal    
DOI: 10.1109/5.659493     Document Type: Article

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