CIF applications. XII. Inspecting Rietveld fits from pdCIF: pdCIFplot

Journal of Applied Crystallography

Volumn 36, Issue 5, 2003, Pages 1285-1287

  Toby, Brian H ^a  

^a NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ARTICLE; AUTOMATION; CALIBRATION; COMPUTER PROGRAM; COMPUTER SYSTEM; CRYSTALLIZATION; CRYSTALLOGRAPHY; DIFFRACTION;

EID: 0141557861     PISSN: 00218898     EISSN: None     Source Type: Journal    
DOI: 10.1107/S0021889803016789     Document Type: Article

References (9)

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2. Hall, S. R., Allen, F. H. & Brown, I. D. (1991). Acta Cryst. A47, 655-685.
3. Larson, A. C. & Von Dreele, R. B. (1986). General Structure Analysis System (GSAS). Report LAUR 86-748. Los Alamos National Laboratory, New Mexico, USA.
4. McCusker, L. B., Von Dreele, R. B., Cox, D. E., Louër, D. & Scardi, P. (1999). J. Appl. Cryst. 32, 36-50.
5. Rietveld, H. M. (1969). J. Appl. Cryst. 2, 65-71.
6. Toby, B. H. (2003a). International Tables for Crystallography. Vol. G, Definition and Exchange of Crystallographic Data, edited by S. R. Hall & B. McMahon, ch. 3.3, Classification and Use of Powder Diffraction Data. In the press.
7. Toby, B. H. (2003b). J. Appl. Cryst. 36, 1288-1289.
8. Toby, B. H., Von Dreele, R. B. & Larson, A. C. (2003). J. Appl. Cryst. 36, 1290-1294.
9. Young, R. A. (1995). Editor. The Rietveld Method, International Union of Crystallography Monographs on Crystallography. Oxford: International Union of Crystallography/Oxford University Press.