Discovering planar disorder in close-packed structures from x-ray diffraction: Beyond the fault model

Physical Review B - Condensed Matter and Materials Physics

Volumn 66, Issue 17, 2002, Pages 1-4

  Varn, D P ^a,b   Canright, G S ^b,c   Crutchfield, J P ^a  

^a SANTA FE INSTITUTE   (United States)

^b UNIVERSITY OF TENNESSEE   (United States)

^c TELENOR RESEARCH   (Norway)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 85038283747     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.66.174110     Document Type: Article

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