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Volumn 5144, Issue , 2003, Pages 864-871
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Paired interferometric measurement of planarity and parallelism
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Author keywords
Interferometry; Optical metrology; Parallelism; Planarity
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Indexed keywords
ERRORS;
INTERFEROMETERS;
LASER APPLICATIONS;
LIGHT REFLECTION;
LIGHT SOURCES;
OPTICAL GLASS;
PRISMS;
REFRACTIVE INDEX;
STANDARDS;
WAVEFRONTS;
OPTICAL METROLOGY;
PARALLELISM;
PLANARITY;
INTERFEROMETRY;
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EID: 0141496975
PISSN: 0277786X
EISSN: None
Source Type: Conference Proceeding
DOI: 10.1117/12.501263 Document Type: Conference Paper |
Times cited : (2)
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References (10)
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