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Volumn 42, Issue 7 A, 2003, Pages 4473-4475

Effect of thermal annealing on morphology of pentacene thin films

Author keywords

Atomic force microscopy; Pentacene; Thermal annealing; X ray diffraction

Indexed keywords

ACTIVATION ENERGY; ANNEALING; ATOMIC FORCE MICROSCOPY; DEPOSITION; GRAIN SIZE AND SHAPE; MORPHOLOGY; POLYCRYSTALLINE MATERIALS; THERMAL EFFECTS; THIN FILMS; VACUUM; X RAY DIFFRACTION ANALYSIS;

EID: 0141494469     PISSN: 00214922     EISSN: None     Source Type: Journal    
DOI: 10.1143/jjap.42.4473     Document Type: Article
Times cited : (34)

References (16)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.