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Volumn 42, Issue 7 A, 2003, Pages 4473-4475
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Effect of thermal annealing on morphology of pentacene thin films
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Author keywords
Atomic force microscopy; Pentacene; Thermal annealing; X ray diffraction
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Indexed keywords
ACTIVATION ENERGY;
ANNEALING;
ATOMIC FORCE MICROSCOPY;
DEPOSITION;
GRAIN SIZE AND SHAPE;
MORPHOLOGY;
POLYCRYSTALLINE MATERIALS;
THERMAL EFFECTS;
THIN FILMS;
VACUUM;
X RAY DIFFRACTION ANALYSIS;
PENTACENE;
THERMAL ANNEALING;
OLEFINS;
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EID: 0141494469
PISSN: 00214922
EISSN: None
Source Type: Journal
DOI: 10.1143/jjap.42.4473 Document Type: Article |
Times cited : (34)
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References (16)
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