Atomic force microscope and anti-corrosion processing of porous alumina

Proceedings of the Second International Symposium on Instrumentation Science and Technology

Volumn 2, Issue , 2002, Pages

  Zhang, Dongxian ^a   Zhang, Haijun ^a   Lin, Xiaofeng ^a   Zhang, Hu ^a  

^a ZHEJIANG UNIVERSITY   (China)

Author keywords

AFM; Anti corrosion; Horizontal; Porous alumina

Indexed keywords

ALUMINA; ANODIC OXIDATION; ATOMIC FORCE MICROSCOPY; CORROSION RESISTANCE; ELECTROCHEMISTRY; ELECTROLYSIS; POROUS MATERIALS; SUBSTRATES; SURFACE PROPERTIES;

ANTI-CORROSION PROCESSING; ELECTROCHEMICAL PROCESSING; POROUS ALUMINA; SURFACE PROCESSING;

CORROSION PREVENTION;

EID: 0141433399     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (7)

1. Binnig G and Rohrer H, "Scanning tunneling microscopy", Helev. Phys. Acta. 55 (4), pp. 726-729, 1982.
2. Binnig G and Quate C F, "Atomic force microscopy", Phys. Rev. Lett. 56 (5), pp. 930-935, 1986.
3. N. Tao, J. Pan, and Y. Li et al., Surf. Sci. 272, pp. 338-341, 1992.
4. V. Maurice, W. Yang, and P. Marcus, J. Electrochem. Soc. 141, pp. 3016-3020, 1994.
5. V. Maurice, H. Talah, and P. Marcus, Surf. Sci. 30, pp. 98-101, 1993.
6. H. Zhang, F. Huang, and T. Higuchi, "Dual unit STM-AFM for length measurement based on reference scales", J. Vac. Sci. Technol. B 15, pp. 780-784, 1997.
7. H. Zhang, L. Wu, and F. Huang, "Electrochemical micro-process by scanning ion-conductance microscope", J. Vac. Sci. Technol. B 17, pp. 269-272, 1999.