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Volumn , Issue 540, 2003, Pages 367-373

Effects of various wavelength ranges of vacuum ultraviolet radiation on Teflon® FEP film

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTALLINE MATERIALS; FUSED SILICA; POLYTETRAFLUOROETHYLENES; TENSILE STRENGTH;

EID: 0141425762     PISSN: 03796566     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper
Times cited : (2)

References (9)
  • 4
    • 85085403094 scopus 로고    scopus 로고
    • Simulated Space Vacuum Ultraviolet (VUV) Exposure Testing for Polymer Films
    • American Institute of Aeronautics and Astronautics, January
    • Dever, J. A., Pietromica, A. J., Stueber, T. J., Sechkar, E. A., Messer, R. K., "Simulated Space Vacuum Ultraviolet (VUV) Exposure Testing for Polymer Films," AIAA Paper No. 2001-1054, American Institute of Aeronautics and Astronautics, January 2001.
    • (2001) AIAA Paper No. 2001-1054 , vol.2001 , Issue.1054
    • Dever, J.A.1    Pietromica, A.J.2    Stueber, T.J.3    Sechkar, E.A.4    Messer, R.K.5
  • 5
    • 0346437626 scopus 로고
    • Electronic Structure of Poly(tetrafluoroethylene) Studied by UPS, VUV Absorption, and Band Calculations
    • Seki, K., Tanaka, H., and Ohta T., "Electronic Structure of Poly(tetrafluoroethylene) Studied by UPS, VUV Absorption, and Band Calculations," Physica Scripta, vol. 41, 1990, pp. 167-171.
    • (1990) Physica Scripta , vol.41 , pp. 167-171
    • Seki, K.1    Tanaka, H.2    Ohta, T.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.