Simulated space vacuum ultraviolet (VUV) exposure testing for polymer films

39th Aerospace Sciences Meeting and Exhibit

Volumn , Issue , 2001, Pages

  Dever, Joyce A ^a   Pietromica, Anthony J ^b   Stueber, Thomas J ^c   Sechkar, Edward A ^c   Messer, Russell K ^d  

^a NASA GLENN RESEARCH CENTER   (United States)

^b OHIO AEROSPACE INSTITUTE   (United States)

^c Dynacs Engineering Company Inc   (United States)

^d CLEVELAND STATE UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

AEROSPACE ENGINEERING; NASA; RADIATION EFFECTS; SEMICONDUCTING FILMS;

CALIBRATION PROCEDURE; ENVIRONMENTAL EXPOSURE; GLENN RESEARCH CENTER; NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY; THIN POLYMER FILMS; THIN SURFACE LAYER; ULTRA LIGHTWEIGHTS; VACUUM ULTRAVIOLET RADIATION;

POLYMER FILMS;

EID: 85085403094     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.2514/6.2001-1054     Document Type: Conference Paper

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