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Volumn 392-396, Issue PART 2, 2003, Pages 1490-1494
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Component test toward single-flux-quantum processors
d
NEC CORPORATION
(Japan)
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Author keywords
ALU; Processor; Registers; SFQ; Superconducting device
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Indexed keywords
ELECTRIC CURRENTS;
INTEGER PROGRAMMING;
MICROPROCESSOR CHIPS;
QUANTUM THEORY;
SINGLE-FLUX-QUANTUM (SFQ) LOGIC;
JOSEPHSON JUNCTION DEVICES;
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EID: 0043286223
PISSN: 09214534
EISSN: None
Source Type: Journal
DOI: 10.1016/S0921-4534(03)00749-4 Document Type: Conference Paper |
Times cited : (11)
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References (9)
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