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Volumn 15, Issue 15, 2003, Pages 2889-2891
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Growth of a high quality quartz film on sapphire by catalyst-enhanced atmospheric-pressure vapor-phase epitaxy using buffer layers
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Author keywords
[No Author keywords available]
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Indexed keywords
ATMOSPHERIC PRESSURE;
CATALYSIS;
QUARTZ;
REFRACTIVE INDEX;
SURFACE ROUGHNESS;
VAPOR PHASE EPITAXY;
BUFFER LAYERS;
FILM GROWTH;
BUFFER;
SILICON DIOXIDE;
ARTICLE;
ATMOSPHERIC PRESSURE;
CATALYST;
FILM;
PHASE TRANSITION;
POLARIMETRY;
STRUCTURE ANALYSIS;
SURFACE PROPERTY;
VAPOR;
X RAY ANALYSIS;
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EID: 0043269349
PISSN: 08974756
EISSN: None
Source Type: Journal
DOI: 10.1021/cm021712m Document Type: Article |
Times cited : (7)
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References (13)
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