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Volumn 7, Issue 2-3, 1999, Pages 113-119
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A scanning force microscope study of detachment of nanometer-sized particles from glass surfaces
a a a a |
Author keywords
Chemical mechanical polishing; Humidity effects; Particle removal
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Indexed keywords
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EID: 0043266528
PISSN: 10238883
EISSN: None
Source Type: Journal
DOI: 10.1023/a:1019129622285 Document Type: Article |
Times cited : (10)
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References (12)
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