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Volumn 38, Issue 10, 1999, Pages 2083-2085

Layer thickness fluctuations in optical coatings with non-quarter-wave design

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EID: 0043234015     PISSN: 1559128X     EISSN: 21553165     Source Type: Journal    
DOI: 10.1364/AO.38.002083     Document Type: Article
Times cited : (4)

References (10)
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  • 3
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    • Characterization of defect geometries in multilayer optical coatings
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    • (1994) J Vac. Sci. Technol. , vol.A12 , pp. 2808-2813
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  • 4
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  • 6
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    • Thermal conductivity of sputtered and evaporated SiO2 and TiO2 optical coatings
    • 2 optical coatings, ” Appl. Phys. Lett. 65, 309-311 (1994).
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    • Cahill, D.G.1    Allen, T.H.2
  • 7
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    • Photothermal characterization of optical thin films
    • Z. L. Wu, P. K. Kuo, L. Wei, S. L. Gu, and R. L. Thomas, “Photothermal characterization of optical thin films, ” Thin Solid Films 236, 191-198 (1993).
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    • Development of a thermographic laser calorimeter
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