Structural and optical properties of ZnO films grown on the AAO templates

Materials Letters

Volumn 57, Issue 26-27, 2003, Pages 4187-4190

  Fang, Zebo ^a   Wang, Yinyue ^a   Peng, Xinping ^a   Liu, Xueqin ^a   Zhen, Congmian ^a  

^a LANZHOU UNIVERSITY   (China)

Author keywords

Atomic force microscopy; Photoluminescence; Rf reactive sputtering; Semiconductors; ZnO thin films

Indexed keywords

ALUMINA; ATOMIC FORCE MICROSCOPY; CARRIER CONCENTRATION; ELECTRIC CONDUCTIVITY; FILM GROWTH; MAGNETRON SPUTTERING; MORPHOLOGY; OPTICAL PROPERTIES; PHOTOLUMINESCENCE; SUBSTRATES; THIN FILMS; X RAY DIFFRACTION ANALYSIS;

EMISSION PEAK;

ZINC OXIDE;

EID: 0043231301     PISSN: 0167577X     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0167-577X(03)00287-8     Document Type: Article

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