Drift mobility of semiconductive La0.5Sr0.5CoO3 films measured using the traveling wave method

Applied Physics Letters

Volumn 76, Issue 5, 2000, Pages 580-582

  Yin, J ^a   Wang, L ^a   Liu, J M ^a   Chen, K J ^a   Liu, Z G ^a   Huang, Q ^b  

^a NANJING UNIVERSITY   (China)

^b NATIONAL UNIVERSITY OF SINGAPORE   (Singapore)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0043190459     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.125823     Document Type: Article

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