Ku-band low noise amplifier with using short-stub ESD protection

IEEE Radio Frequency Integrated Circuits Symposium, RFIC, Digest of Technical Papers

Volumn , Issue , 2003, Pages 671-674

  Park, Chang Kun ^a   Kim, Min Gun ^b   Kim, Chung Han ^b   Hong, Songcheol ^a  

^a Korea Advanced Institute of Science and Technology (KAIST)   (South Korea)

^b Teltron   (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

FREQUENCIES; HIGH ELECTRON MOBILITY TRANSISTORS; POWER AMPLIFIERS; SHORT CIRCUIT CURRENTS;

LOW NOISE AMPLIFIERS;

SPURIOUS SIGNAL NOISE;

EID: 0043162126     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (5)

1. B. Kleveland, et al., "Distributed ESD Protection for High-Speed Integrated Circuits" IEEE Electron Device Lett., vol. 21, no. 8, pp. 390-329, 2000
2. K. Bock., "ESD issues in compound semiconductor high-frequency devices and circuits" Microelectronics Reliability., vol. 38, pp. 1781-1793, 1998.
3. Ajith Amerasekera, Charvaka Duvvury.,"ESD in silicon integrated circuits" WILEY., pp. 17-19, 1996.
4. B. Kleveland and T. H. Lee, "Distributed ESD protection device for high speed integrated circuits", U. S. Patent 5,969,929.
5. G. Croft, J. Bernier, "ESD protection techniques for high frequency integrated circuits" Microelectronics Reliability., vol. 38, pp. 1681-1689, 1998.