Anomalous diffraction effect on the surface core-level photoemission from Si(001)2 × 1-Cs surface

Journal of Electron Spectroscopy and Related Phenomena

Volumn 88-91, Issue , 1998, Pages 539-543

  Abukawa, T ^a   Johansson, L S O ^b   Bullock, E L ^c   Patthey, L ^d   Kono, S ^a  

^a TOHOKU UNIVERSITY   (Japan)

^b TU DORTMUND UNIVERSITY   (Germany)

^c UNIVERSITY OF LAUSANNE   (Switzerland)

^d UPPSALA UNIVERSITY   (Sweden)

Author keywords

Layer attenuation model; Photoelectron diffraction; Photoemission intensity; Surface core level shifts

Indexed keywords

EID: 0043140246     PISSN: 03682048     EISSN: None     Source Type: Journal    
DOI: 10.1016/s0368-2048(97)00159-x     Document Type: Article

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