Measurement based modeling of power amplifiers for reliable design of modern communication systems

IEEE MTT-S International Microwave Symposium Digest

Volumn 2, Issue , 2003, Pages 795-798

  Soury, Arnaud ^a   Ngoya, Edouard ^a   Nébus, Jean Michel ^a   Reveyrand, Tibault ^b  

^a UNIVERSITY OF LIMOGES   (France)

^b CNES   (France)

Author keywords

[No Author keywords available]

Indexed keywords

BROADBAND AMPLIFIERS; COMMUNICATION SYSTEMS; FIELD EFFECT TRANSISTORS; IMPULSE RESPONSE; NONLINEAR DISTORTION; SEMICONDUCTOR DEVICE MODELS; SYSTEMS ANALYSIS; TIME DOMAIN ANALYSIS; WAVEFORM ANALYSIS;

MEMORY EFFECTS;

POWER AMPLIFIERS;

EID: 0043095356     PISSN: 0149645X     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (7)

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3. th IEEE instrumentation measurement technology conference, IMTC, pp. 193-197, 1999.
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6. C. J. Clark, G. Chrisikos, & Al, "Time-Domain Envelope Measurement Technique with application to Wideband Power Amplifier Modeling", IEEE Trans. Microw. Theor. Techn., Vol 46, n° 12, pp. 2531-2540, Dec 1998.
7. T. Reveyrand, &Al, "A Calibrated Time-Domain Envelope Measurement System for the Behavioral Modeling of Power Amplifiers", European Microwave Week, GaAs Conference, pp. 237-240, Oct 2002.