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Volumn 4979, Issue , 2003, Pages 402-409

Expansion of SU-8 application scope by PAG concentration modification

Author keywords

Minimum bottom dose; PAG concentration; PEB temperature and time; SU 8 modification; UV absorption

Indexed keywords

CONCENTRATION (PROCESS); CRYSTAL MICROSTRUCTURE; LIGHT ABSORPTION; OPTIMIZATION; PHOTOLITHOGRAPHY; PHOTORESISTS; TEMPERATURE; X RAY LITHOGRAPHY;

EID: 0043064235     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.478254     Document Type: Conference Paper
Times cited : (11)

References (12)
  • 1
    • 0033724050 scopus 로고    scopus 로고
    • Improved patterning quality of SU-8 microstructures by optimizing the exposure parameters
    • Z. Ling, K. Lian and L. Jian, "Improved patterning quality of SU-8 microstructures by optimizing the exposure parameters", SPIE 3999, pp. 1019-1027, 2000
    • (2000) SPIE , vol.3999 , pp. 1019-1027
    • Ling, Z.1    Lian, K.2    Jian, L.3
  • 2
    • 0029227196 scopus 로고
    • High aspect ratio resist for thick film applications
    • N. LaBianca, and J. D. Gelorme, "High aspect ratio resist for thick film applications," SPIE 2438, pp. 846-852 1995
    • (1995) SPIE , vol.2438 , pp. 846-852
    • LaBianca, N.1    Gelorme, J.D.2
  • 5
    • 0041979362 scopus 로고    scopus 로고
    • Use of SU-8 photoresist for very high aspect ratio x-ray lithography
    • A. Bogdanov and S. Peredkov, "Use of SU-8 photoresist for very high aspect ratio x-ray lithography". (http://maxsun5.maxlab.lu.se/beamlines/bld811/manuscript.pdf)
    • Bogdanov, A.1    Peredkov, S.2
  • 6
    • 0034768376 scopus 로고    scopus 로고
    • Reduction of internal stress in a SU-8-like negative tone photoresist for MEMS applications by chemical modification
    • R. Ruhmann, G. Ahrens, A. Schutz, J. Voskuhl and G. Grutzner, "Reduction of internal stress in a SU-8-like negative tone photoresist for MEMS applications by chemical modification", SPIE 4345, pp. 502-510 2001
    • (2001) SPIE , vol.4345 , pp. 502-510
    • Ruhmann, R.1    Ahrens, G.2    Schutz, A.3    Voskuhl, J.4    Grutzner, G.5
  • 7
    • 0042981021 scopus 로고    scopus 로고
    • SU-8 as negative resist in deep x-ray lithography
    • Baden-Baaden, Germany
    • L. Jian, G. Aigeldinger, Y. Desta and J. Goettert, "SU-8 as negative resist in deep x-ray lithography", HARMST2001, Baden-Baaden, Germany, 2001
    • (2001) HARMST2001
    • Jian, L.1    Aigeldinger, G.2    Desta, Y.3    Goettert, J.4
  • 9
    • 0041478300 scopus 로고    scopus 로고
    • Contact Pascal Meyer at pascal.meyer@imt.fzk.de (Institute for Microstructure Technology, Research Center, Karlsruhe, Germany)
    • Contact Pascal Meyer at pascal.meyer@imt.fzk.de (Institute for Microstructure Technology, Research Center, Karlsruhe, Germany)
  • 10
    • 0036575004 scopus 로고    scopus 로고
    • Comparison of PMMA and SU-8 resist moulds for embossing of PZT to produce high-aspect-ratio microstructure, using LIGA process
    • A. Schneider, B. Su, T. Button, L. Singleton, O. Wilhelmi, S. Hug, P. Prewett and R. Lawes, "Comparison of PMMA and SU-8 resist moulds for embossing of PZT to produce high-aspect-ratio microstructure, using LIGA process", Microsystem Technologies 8, pp.88-92, 2002
    • (2002) Microsystem Technologies , vol.8 , pp. 88-92
    • Schneider, A.1    Su, B.2    Button, T.3    Singleton, L.4    Wilhelmi, O.5    Hug, S.6    Prewett, P.7    Lawes, R.8


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.