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Volumn 23, Issue 4, 2002, Pages 545-573

Thermal modelling and characterisation of semiconductor bolometers

Author keywords

Bolometers; Cryogenic detectors; NTD

Indexed keywords

CRYOGENIC EQUIPMENT; CURRENT VOLTAGE CHARACTERISTICS; DATA ACQUISITION; ERROR ANALYSIS; NONLINEAR EQUATIONS; OPTIMIZATION; PARAMETER ESTIMATION; SPECIFIC HEAT; THERMAL CONDUCTIVITY; THERMAL EFFECTS; THERMISTORS;

EID: 0043059073     PISSN: 01959271     EISSN: None     Source Type: Journal    
DOI: 10.1023/A:1015705826900     Document Type: Article
Times cited : (23)

References (22)
  • 2
    • 1942462593 scopus 로고    scopus 로고
    • Piacentini, F, P A R Ade, R Bathia, J J Bock, A Boscaleri, P Cardoni, B P Grill, P de Bernardis, H Del Castillo, G de Troia, P Farese, M Giacometti, E F Hivon, V V Hristov, A lacoangeli, A E Lange, S Masi, P D Mauskopf, L Miglio, C B Netterfield, P Palangio, Pascale, A Raccanelli, S Rao, G Romeo, J Ruhl, and F Scaramuzzi (submitted to Ap. J.)
    • Piacentini, F, P A R Ade, R Bathia, J J Bock, A Boscaleri, P Cardoni, B P Grill, P de Bernardis, H Del Castillo, G de Troia, P Farese, M Giacometti, E F Hivon, V V Hristov, A lacoangeli, A E Lange, S Masi, P D Mauskopf, L Miglio, C B Netterfield, P Palangio, Pascale, A Raccanelli, S Rao, G Romeo, J Ruhl, and F Scaramuzzi (submitted to Ap. J.)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.