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Volumn 13, Issue 12, 1998, Pages 3442-3448

The effect of oxygen partial pressure during cooling on lead zirconate titanate thin film growth by using rf magnetron sputtering method

Author keywords

[No Author keywords available]

Indexed keywords


EID: 0043031001     PISSN: 08842914     EISSN: None     Source Type: Journal    
DOI: 10.1557/JMR.1998.0468     Document Type: Article
Times cited : (3)

References (18)
  • 5
    • 0005016276 scopus 로고    scopus 로고
    • Ferroelectric Thin Film V, edited by S.B. Desu, R. Ramesh, B.A. Tuttle, R.E. Jones, and I.K. Yoo Pittsburgh, PA
    • T.S. Kim, D.J. Kim, J.K. Lee, and H.J. Jung, in Ferroelectric Thin Film V, edited by S.B. Desu, R. Ramesh, B.A. Tuttle, R.E. Jones, and I.K. Yoo (Mater Res. Soc. Symp. Proc. 433, Pittsburgh, PA, 1996), p. 243.
    • (1996) Mater Res. Soc. Symp. Proc. , vol.433 , pp. 243
    • Kim, T.S.1    Kim, D.J.2    Lee, J.K.3    Jung, H.J.4
  • 10
    • 0009714496 scopus 로고
    • Ferroelectric Thin Film II, edited by A. Kingon, E.R. Myers, and B. Tuttle Pittsburgh, PA
    • C.K. Kwok and S.B. Desu, in Ferroelectric Thin Film II, edited by A. Kingon, E.R. Myers, and B. Tuttle (Mater. Res. Soc. Symp. Proc. 243, Pittsburgh, PA, 1992), p. 393.
    • (1992) Mater. Res. Soc. Symp. Proc. , vol.243 , pp. 393
    • Kwok, C.K.1    Desu, S.B.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.