Nondestructive electroluminescence characterization of as-grown semiconductor optoelectronic device structures using indium-tin-oxide coated electrodes

Review of Scientific Instruments

Volumn 71, Issue 4, 2000, Pages 1911-1912

  Ghosh, Sandip ^a   Hosea, Thomas J C ^a  

^a UNIVERSITY OF SURREY   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000545279     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1150550     Document Type: Article

References (4)

1. D. K. Schroder, Semiconductor Material and Device Characterization (Wiley, New York, 1998); G. D. Gilliland, Mater. Sci. Eng. 18, 99 (1997).
2. D. K. Schroder, Semiconductor Material and Device Characterization (Wiley, New York, 1998); G. D. Gilliland, Mater. Sci. Eng. 18, 99 (1997).
3. T. E. Sale, Vertical Cavity Surface Emitting Lasers (Research Studies, Taunton, 1995).
4. C. H. Henry, R. A. Logan, H. Temkin, and F. R. Merritt, IEEE J. Quantum Electron. QE-19, 941 (1983).