Interferometric characterization of phase masks

Applied Optics

Volumn 42, Issue 13, 2003, Pages 2336-2340

  Sumetsky, Mikhail ^a   Dulashko, Yury ^a   White, Tom P ^c   Olsen, Tim ^b   Westbrook, Paul S ^a   Eggleton, Benjamin J ^c  

^a OFS LABORATORIES   (United States)

^b OFS LABS   (United States)

^c UNIVERSITY OF SYDNEY   (Australia)

Author keywords

[No Author keywords available]

Indexed keywords

INTERFEROMETERS; LIGHT INTERFERENCE; OPTICAL FIBERS; OPTICAL RESOLVING POWER;

PHASE MASKS;

DIFFRACTION GRATINGS;

EID: 0042973750     PISSN: 1559128X     EISSN: 21553165     Source Type: Journal    
DOI: 10.1364/AO.42.002336     Document Type: Article

References (9)

1. C. Palmer, Diffraction Grating Handbook, E. Loewen, ed. (Richardson Grating Laboratory, Rochester, New York, 2002), and references therein; available at http://www.gratinglab.com.
2. E. G. Loewen and E. Popov, Diffraction Gratings and Applications (Marcel Dekker, New York, 1997).
3. R. Kashyap, Fiber Bragg Gratings (Academic, New York, 1999).
4. B. J. Eggleton, A. Ahuja, P. S. Westbrook, J. A. Rogers, P. Kuo, T. N. Nielsen, and B. Mikkelsen, “Integrated tunable fiber gratings for dispersion management in high-bit rate system,” J. Lightwave Technol. 18, 1418-1432 (2000).
5. M. Sumetsky, B. J. Eggleton, and C. M. de Sterke, “Theory of group delay ripple generated by chirped fiber gratings,” Opt. Express 10, 332-340 (2002); http://www.opticsexpress.org.
6. F. Barnier, P. E. Dyer, H. V. Snelling, and R. M. De la Rue, “Sub-nanometer metrology of chirped phase masks by optical Moire,” Opt. Commun. 170, 175-179 (1999).
7. K. Creath, “Phase-measurement interferometry techniques,” in Progress in Optics, E. Wolf, ed. (Elsevier Science, Amsterdam, 1988), Vol. 26, pp. 349-393.
8. F. El-Diasty, A. Heaney, and T. Erdogan, “Analysis of fiber Bragg gratings by a side-diffraction interference technique,” Appl. Opt. 40, 890-896 (2001).
9. M. Born and E. Wolf, Principles ofOptics (Cambridge U. Press, New York, 1999).