The detection of defects in a niobium tri-layer process

IEEE Transactions on Applied Superconductivity

Volumn 13, Issue 2 I, 2003, Pages 95-98

  Joseph, Arun A ^a   Heuvelmans, Sander ^a   Gerritsma, Gerrit J ^b   Kerkhoff, Hans G ^a  

^a UNIVERSITY OF TWENTE   (Netherlands)

^b UNIVERSITY OF TWENTE   (Netherlands)

Author keywords

Defect based testing; PDM; RSFQ circuit testing; Structural testing; Superconductor devices

Indexed keywords

DEFECTS; ELECTRIC POWER SYSTEM INTERCONNECTION; MICROPROCESSOR CHIPS; NIOBIUM; PROBABILITY DISTRIBUTIONS; SCANNING ELECTRON MICROSCOPY;

DEFECT-BASED TESTING;

JOSEPHSON JUNCTION DEVICES;

EID: 0042944198     PISSN: 10518223     EISSN: None     Source Type: Journal    
DOI: 10.1109/TASC.2003.813654     Document Type: Conference Paper

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