Electron microscopy studies of thin Mo films grown by MBE on (1 0 0) SrTiO3 substrates

Surface Science

Volumn 542, Issue 1-2, 2003, Pages 33-44

  Tchernychova, E ^a   Scheu, C ^a   Wagner, T ^a   Fu, Q ^a   Ruhle M ^a  

^a MAX PLANCK INSTITUTE FOR INTELLIGENT SYSTEMS   (Germany)

Author keywords

Electron microscopy; Epitaxy; Grain boundaries; Metallic films; Molybdenum

Indexed keywords

GRAIN BOUNDARIES; METALLIC FILMS; MOLECULAR BEAM EPITAXY; STRONTIUM COMPOUNDS; TRANSMISSION ELECTRON MICROSCOPY; X RAY DIFFRACTION ANALYSIS;

DOMAIN VARIANTS;

FILM GROWTH;

EID: 0042921621     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0039-6028(03)00996-8     Document Type: Article

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