Preferred crystallographic orientation relationships of nickel films deposited on (100) cubic-zirconia substrates

Thin Solid Films

Volumn 372, Issue 1, 2000, Pages 37-44

  Dickey, E C ^a   Bagiyono, Y Maa ^a   Lian, G D ^a   Sinnott, S B ^a   Wagner, T ^b  

^a UNIVERSITY OF KENTUCKY   (United States)

^b MAX PLANCK INSTITUTE FOR INTELLIGENT SYSTEMS   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

BACKSCATTERING; COMPUTATIONAL METHODS; CRYSTAL ATOMIC STRUCTURE; CRYSTAL LATTICES; CRYSTAL ORIENTATION; DEPOSITION; ELECTRON DIFFRACTION; ELECTRON SCATTERING; FILM GROWTH; NICKEL; ZIRCONIA;

NEAR COINCIDENCE SITE LATTICE THEORY; ORIENTATION IMAGING MICROSCOPY (OIM);

METALLIC FILMS;

EID: 0034275857     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0040-6090(00)01052-X     Document Type: Article

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