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Volumn 140, Issue 1-3 SPEC., 2003, Pages 274-279

Study of electrical discharge machining technology for slicing silicon ingots

Author keywords

Current off time; Current on time; Servo voltage; Silicon ingot; Surface roughness; WEDM

Indexed keywords

DEFECTS; INGOTS; POLISHING; SCANNING ELECTRON MICROSCOPY; SILICON WAFERS; SURFACE ROUGHNESS; WIRE;

EID: 0042911877     PISSN: 09240136     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0924-0136(03)00718-0     Document Type: Conference Paper
Times cited : (76)

References (5)
  • 1
    • 0027845120 scopus 로고
    • Stress analysis of a silicon-wafer slicer cutting the crystal ingot
    • Chonan S., Jiang M.Y., Yukiy L. Stress analysis of a silicon-wafer slicer cutting the crystal ingot. J. Mech. Des. 115:1993;517-711.
    • (1993) J. Mech. Des. , vol.115 , pp. 517-711
    • Chonan, S.1    Jiang, M.Y.2    Yukiy, L.3
  • 2
    • 0027677519 scopus 로고
    • Vibration and defection of a silicon-wafer slicer cutting the crystal ingot
    • Chonan S., Jiang M.Y., Yukiy L. Vibration and defection of a silicon-wafer slicer cutting the crystal ingot. J. Vibr. Acoust. 115:1993;529-534.
    • (1993) J. Vibr. Acoust. , vol.115 , pp. 529-534
    • Chonan, S.1    Jiang, M.Y.2    Yukiy, L.3
  • 3
    • 0032099414 scopus 로고    scopus 로고
    • Modeling stresses of contacts in wire saw slicing of polycrystalline and crystalline ingots: Application to silicon wafer production
    • Li J., Kao I., Prasad V. Modeling stresses of contacts in wire saw slicing of polycrystalline and crystalline ingots: application to silicon wafer production. J. Electron. Packaging. 120:1998;123-128.
    • (1998) J. Electron. Packaging , vol.120 , pp. 123-128
    • Li, J.1    Kao, I.2    Prasad, V.3
  • 4
    • 0032644273 scopus 로고    scopus 로고
    • Development of a resinoid diamond wire containing metal powder for slicing a slicing ingot
    • Shimazaki Y., Tani Y., Suzuki M., Kanda Y. Development of a resinoid diamond wire containing metal powder for slicing a slicing ingot. Ann. CIRP. 48(1):1999;273-276.
    • (1999) Ann. CIRP , vol.48 , Issue.1 , pp. 273-276
    • Shimazaki, Y.1    Tani, Y.2    Suzuki, M.3    Kanda, Y.4
  • 5
    • 0006506850 scopus 로고
    • Investigation of silicon wafering by wire EDM
    • Luo Y.F., Chen C.G., Tong Z.F. Investigation of silicon wafering by wire EDM. J. Mater. Sci. 27:1992;5805-5810.
    • (1992) J. Mater. Sci. , vol.27 , pp. 5805-5810
    • Luo, Y.F.1    Chen, C.G.2    Tong, Z.F.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.