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Volumn 511, Issue 1-2, 2003, Pages 82-87

Simulation of signal in irradiated silicon pixel detectors

Author keywords

Charge collection efficiency; Effective carrier trapping time; Silicon detectors; Simulation

Indexed keywords

COMPUTER SIMULATION; IRRADIATION; SENSORS; SILICON;

EID: 0042889450     PISSN: 01689002     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0168-9002(03)01756-X     Document Type: Conference Paper
Times cited : (15)

References (21)
  • 3
    • 0041908119 scopus 로고    scopus 로고
    • hep-ph/0204087, 2002
    • F. Gianotti, et al., hep-ph/0204087, 2002.
    • Gianotti, F.1
  • 15
    • 0042409298 scopus 로고    scopus 로고
    • ISE-TCAD, ISE Integrated Systems Engineering AG, Zurich/CH, Software Release 6.1
    • ISE-TCAD, ISE Integrated Systems Engineering AG, Zurich/CH, Software Release 6.1.
  • 20
    • 0042910226 scopus 로고    scopus 로고
    • private communication
    • E. Fretwurst, private communication.
    • Fretwurst, E.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.