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Volumn 124, Issue 3, 2002, Pages 298-304

Micro-mechanics of creep-fatigue damage in PB-SN solder due to thermal cycling - Part II: Mechanistic insights and cyclic durability predictions from monotonic data

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Indexed keywords


EID: 0042871628     PISSN: 10437398     EISSN: None     Source Type: Journal    
DOI: 10.1115/1.1493203     Document Type: Article
Times cited : (20)

References (12)
  • 1
    • 0042371300 scopus 로고    scopus 로고
    • Micro-mechanics of creep-fatigue damage in Pb-Sn solder due to thermal cycling: Part I (formulation)
    • published in this issue
    • Sharma, P., and Dasgupta, A., 2002, "Micro-Mechanics Of Creep-Fatigue Damage In Pb-Sn Solder Due To Thermal Cycling: Part I (Formulation)," ASME J. Electron. Packag., published in this issue, pp.
    • (2002) ASME J. Electron. Packag.
    • Sharma, P.1    Dasgupta, A.2
  • 2
    • 85199300220 scopus 로고    scopus 로고
    • Ph.D. dissertation, Dept. of Mechanical Engineering, University of Maryland, College Park
    • Sharma, P., 2000, Ph.D. dissertation, Dept. of Mechanical Engineering, University of Maryland, College Park.
    • (2000)
    • Sharma, P.1
  • 5
    • 0020006688 scopus 로고
    • On creep fracture by void growth
    • Cocks, A. C. F., and Ashby, M. F., 1982. "On creep fracture by void growth," Prog. Mater. Sci., 27, pp. 189-244.
    • (1982) Prog. Mater. Sci. , vol.27 , pp. 189-244
    • Cocks, A.C.F.1    Ashby, M.F.2
  • 6
    • 85013292283 scopus 로고
    • Solder creep-fatigue analysis by an energy-partitioning approach
    • Dasgupta, A., Oyan, C., Barker, D., and Pecht, M., 1992, "Solder Creep-Fatigue Analysis by an Energy-Partitioning Approach," ASME J. Electron. Packag., 144, pp. 152-160.
    • (1992) ASME J. Electron. Packag. , vol.144 , pp. 152-160
    • Dasgupta, A.1    Oyan, C.2    Barker, D.3    Pecht, M.4
  • 8
    • 0042586347 scopus 로고
    • A microstructurally based model of solder joints under conditions of thermomechanical fatigue
    • Advances in Electronic Packaging 1995
    • Frear, D. R., Burchett, S. N., and Rashid, M. M., 1995, "A microstructurally based model of solder joints under conditions of thermomechanical fatigue," Advances in Electronic Packaging 1995, Proceedings of the International Electronic Packaging Conference-INTERpack '95 p. 2 vol. xvi+1320, 347-60, vol. 1.
    • (1995) Proceedings of the International Electronic Packaging Conference-INTERpack '95 , vol.16-1320 , pp. 2
    • Frear, D.R.1    Burchett, S.N.2    Rashid, M.M.3
  • 9
    • 0041584330 scopus 로고    scopus 로고
    • Frear, D. R., Burchett, S. N., and Rashid, M. M., 1995, "A microstructurally based model of solder joints under conditions of thermomechanical fatigue," Advances in Electronic Packaging 1995, Proceedings of the International Electronic Packaging Conference-INTERpack '95 p. 2 vol. xvi+1320, 347-60, vol. 1.
    • Proceedings of the International Electronic Packaging Conference-INTERpack '95 , vol.1 , pp. 347-360
  • 10
    • 85199289325 scopus 로고    scopus 로고
    • Ph.D. dissertation, Dept. of Mechanical Engineering, University of Maryland, College Park
    • Upadhyayula, K. S., 1998, Ph.D. dissertation, Dept. of Mechanical Engineering, University of Maryland, College Park.
    • (1998)
    • Upadhyayula, K.S.1
  • 11
    • 0042586348 scopus 로고    scopus 로고
    • Effect of high temperature aging on solder joint degradation in FCOB assemblies
    • ASME, June
    • Okura, J. H., and Dasgupta, A., 1999, "Effect of High Temperature Aging on Solder Joint Degradation in FCOB Assemblies," Imerpack99, ASME, June.
    • (1999) Imerpack99
    • Okura, J.H.1    Dasgupta, A.2
  • 12
    • 0043087007 scopus 로고    scopus 로고
    • Micromechanics of creep fracture: Simulation of intergranular crack growth
    • Onck, P., and van der Giessen, E., 1998, "Micromechanics of creep fracture: simulation of intergranular crack growth," Comput. Mater. Sci., 13(1-3), pp. 90-102.
    • (1998) Comput. Mater. Sci. , vol.13 , Issue.1-3 , pp. 90-102
    • Onck, P.1    Van Der Giessen, E.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.