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Volumn 4932, Issue , 2003, Pages 136-146

An overview of raster scanning for ICF-class laser optics

Author keywords

[No Author keywords available]

Indexed keywords

LASER BEAMS; LIGHT ABSORPTION; SCANNING;

EID: 0042863072     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.472050     Document Type: Conference Paper
Times cited : (16)

References (7)
  • 1
    • 0032681662 scopus 로고    scopus 로고
    • A study of laser conditioning methods of hafnia silica multilayer mirrors
    • Laser-Induced Damage in Optical Materials; 1998, Gregory J. Exarhos, Arthur H. Guenther, Mark R. Kozlowski, Keith Lewis, and M. J. Soileau, Editors
    • Christopher J. Stolz, Lynn M. Sheehan, Stephen M. Maricle, Sheldon Schwartz, "A study of laser conditioning methods of hafnia silica multilayer mirrors," in Laser-Induced Damage in Optical Materials; 1998, Gregory J. Exarhos, Arthur H. Guenther, Mark R. Kozlowski, Keith Lewis, and M. J. Soileau, Editors, SPIE Vol. 3578, 144-153 (1999).
    • (1999) SPIE , vol.3578 , pp. 144-153
    • Stolz, C.J.1    Sheehan, L.M.2    Maricle, S.M.3    Schwartz, S.4
  • 2
    • 0036035459 scopus 로고    scopus 로고
    • UV laser conditioning for the reduction of 351-nm damage initiation in fused silica
    • Laser-Induced Damage in Optical Materials: 2001, Gregory J. Exarhos, Arthur H. Guenther, Keith Lewis, M. J. Soileau, and Christopher J. Stolz, Editors
    • Raymond M. Brusasco, Bernie M. Penetrante, John E. Peterson, Stephen M. Maricle, Joseph A. Menapace, "UV laser conditioning for the reduction of 351-nm damage initiation in fused silica," in Laser-Induced Damage in Optical Materials: 2001, Gregory J. Exarhos, Arthur H. Guenther, Keith Lewis, M. J. Soileau, and Christopher J. Stolz, Editors, SPIE Vol. 4679, 48-55 (2002).
    • (2002) SPIE , vol.4679 , pp. 48-55
    • Brusasco, R.M.1    Penetrante, B.M.2    Peterson, J.E.3    Maricle, S.M.4    Menapace, J.A.5
  • 3
    • 0036033574 scopus 로고    scopus 로고
    • The results of raster-scan laser conditioning studies on DKDP triplers using Nd:YAG and excimer lasers
    • Laser-Induced Damage in Optical Materials: 2001, Gregory J. Exarhos, Arthur H. Guenther, Keith Lewis, M. J. Soileau, and Christopher J. Stolz, Editors
    • Michael J. Runkel, Kurt Neeb, Michael Staggs, Jerome M. Auerbach, Alan K. Burnham, "The results of raster-scan laser conditioning studies on DKDP triplers using Nd:YAG and excimer lasers," in Laser-Induced Damage in Optical Materials: 2001, Gregory J. Exarhos, Arthur H. Guenther, Keith Lewis, M. J. Soileau, and Christopher J. Stolz, Editors, SPIE Vol. 4679, 368-383 (2002).
    • (2002) SPIE , vol.4679 , pp. 368-383
    • Runkel, M.J.1    Neeb, K.2    Staggs, M.3    Auerbach, J.M.4    Burnham, A.K.5
  • 4
    • 0031289926 scopus 로고    scopus 로고
    • Laser conditioning study of KDP on the optical sciences laser using large area beams
    • Laser-Induced Damage in Optical Materials: 1997, Gregory J. Exarhos, Arthur H. Guenther, Mark R. Kozlowski, and M. J. Soileau, Editors
    • Michael J. Runkel, James J. De Yoreo, Walter D. Sell, David Milam, "Laser conditioning study of KDP on the Optical Sciences Laser using large area beams," in Laser-Induced Damage in Optical Materials: 1997, Gregory J. Exarhos, Arthur H. Guenther, Mark R. Kozlowski, and M. J. Soileau, Editors, SPIE Vol. 3244, 51-63 (1998).
    • (1998) SPIE , vol.3244 , pp. 51-63
    • Runkel, M.J.1    De Yoreo, J.J.2    Sell, W.D.3    Milam, D.4
  • 5
    • 0042452379 scopus 로고    scopus 로고
    • note
    • Unpublished results on post-test inspection of prototype NIF Final Optics Assembly tested on the Beamlet laser.
  • 6
    • 0032690613 scopus 로고    scopus 로고
    • Current 3ω large optic test procedures and data analysis for the quality assurance of national ignition facility optics
    • Laser-Induced Damage in Optical Materials: 1998, Gregory J. Exarhos, Arthur H. Guenther, Mark R. Kozlowski, Keith Lewis, and M. J. Soileau, Editors
    • Sheldon Schwartz, Michael D. Feit, Mark R. Kozlowski, Ron Mouser, "Current 3ω Large Optic test procedures and data analysis for the quality assurance of National Ignition Facility optics," in Laser-Induced Damage in Optical Materials: 1998, Gregory J. Exarhos, Arthur H. Guenther, Mark R. Kozlowski, Keith Lewis, and M. J. Soileau, Editors, SPIE Vol. 3578, 314-321 (1999).
    • (1999) SPIE , vol.3578 , pp. 314-321
    • Schwartz, S.1    Feit, M.D.2    Kozlowski, M.R.3    Mouser, R.4
  • 7
    • 0041360158 scopus 로고    scopus 로고
    • Effects of pulse duration on bulk laser damage in 350-nm raster-scanned DKDP
    • to be published in Laser-Induced Damage in Optical Materials: 2002, Gregory J. Exarhos, Arthur H. Guenther, Keith Lewis, M. J. Soileau, and Christopher J. Stolz, Editors
    • Michael J. Runkel, Justin R. Bruere, Walter D. Sell, Timothy L. Weiland, Douglas E. Hahn, Mike C. Nostrand, "Effects of pulse duration on bulk laser damage in 350-nm raster-scanned DKDP," to be published in Laser-Induced Damage in Optical Materials: 2002, Gregory J. Exarhos, Arthur H. Guenther, Keith Lewis, M. J. Soileau, and Christopher J. Stolz, Editors, SPIE Vol. 4679, (2003).
    • (2003) SPIE , vol.4679
    • Runkel, M.J.1    Bruere, J.R.2    Sell, W.D.3    Weiland, T.L.4    Hahn, D.E.5    Nostrand, M.C.6


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.