Pseudo spackle pattern photography algorithm development and experimental calibration

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 5058, Issue , 2003, Pages 266-272

  Fu, Shan ^a   Irving, Phil ^a   Furfari, Domenico ^a  

^a CRANFIELD UNIVERSITY   (United Kingdom)

Author keywords

Image Processing; Speckle Pattern Photography; Surface Strain Measurement

Indexed keywords

ALGORITHMS; CALIBRATION; DEFORMATION; PATTERN MATCHING; PHOTOGRAPHY; SENSORS; STRAIN MEASUREMENT;

SPECKLE PATTERN PHOTOGRAPHY;

SPECKLE;

EID: 0042859783     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.509763     Document Type: Conference Paper

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