Application of nonlinearity measures to chemical sensor signals

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 5115, Issue , 2003, Pages 92-100

  Smulko, J M ^a,c   Kish, L B ^a   Schmera, Gabor ^b  

^a TEXAS A AND M UNIVERSITY   (United States)

^b Naval Command   (United States)

^c GDANSK UNIVERSITY OF TECHNOLOGY   (Poland)

Author keywords

Bispectra; Chemical sensors; Electronic tongue; Gas sensors; Higher order statistics; Noise; Non linearity

Indexed keywords

CARRIER CONCENTRATION; ELECTRIC RESISTANCE; ELECTRON DEVICES; FEATURE EXTRACTION; RANDOM PROCESSES; SEMICONDUCTING FILMS; SENSITIVITY ANALYSIS; SPECTRUM ANALYSIS; SPURIOUS SIGNAL NOISE; TIME SERIES ANALYSIS;

BISPECTRA; CHEMICAL SENSOR SIGNALS; ELECTRONIC TONGUE; HIGHER ORDER STATISTICS; NOISE GENERATION;

CHEMICAL SENSORS;

EID: 0042825309     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.499779     Document Type: Conference Paper

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