메뉴 건너뛰기




Volumn 44, Issue 3 PART 1, 1997, Pages 747-751

Performance of microgap gas chambers fabricated with selected anode metals

Author keywords

[No Author keywords available]

Indexed keywords


EID: 0042800544     PISSN: 00189499     EISSN: None     Source Type: Journal    
DOI: 10.1109/23.603744     Document Type: Article
Times cited : (6)

References (13)
  • 1
    • 0027682049 scopus 로고
    • The micro-gap chamber
    • F. Angelini et al, "The micro-gap chamber," Nucl. Instr. Meth., A335 (1993) 69.
    • (1993) Nucl. Instr. Meth. , vol.A335 , pp. 69
    • Angelini, F.1
  • 2
    • 0028517097 scopus 로고
    • Further test and development of the micro-gap chamber
    • F. Angelini et al, "Further test and development of the micro-gap chamber," Nucl. Instr. Meth., A349 (1994) 412.
    • (1994) Nucl. Instr. Meth. , vol.A349 , pp. 412
    • Angelini, F.1
  • 3
    • 0001543833 scopus 로고
    • A large area, high gain Micro-Gap Chamber
    • F. Angelini et al, "A large area, high gain Micro-Gap Chamber," Nucl. Instr. Meth., A362 (1995) 273.
    • (1995) Nucl. Instr. Meth. , vol.A362 , pp. 273
    • Angelini, F.1
  • 4
    • 0030171995 scopus 로고    scopus 로고
    • A Large Area MicroGap Chamber with Two-Dimensional Read-Out
    • F. Angelini et al, "A Large Area MicroGap Chamber With Two-Dimensional Read-Out," IEEE Trans. Nuc. Sci., Vol. 43, No. 3 (1996) pp. 1237-1242.
    • (1996) IEEE Trans. Nuc. Sci. , vol.43 , Issue.3 , pp. 1237-1242
    • Angelini, F.1
  • 5
    • 0023862340 scopus 로고
    • Position-Sensitive Detector with Microstrip Anode for Electron Multiplication with Gases
    • A. Oed, "Position-Sensitive Detector with Microstrip Anode for Electron Multiplication with Gases," Nucl. Instr. Meth., A263 (1988) 351.
    • (1988) Nucl. Instr. Meth. , vol.A263 , pp. 351
    • Oed, A.1
  • 6
    • 0003134597 scopus 로고
    • Properties of micro-strip gas chambers (MSGC) and recent developments
    • A. Oed, "Properties of micro-strip gas chambers (MSGC) and recent developments," Nucl. Instr. Meth., A367 (1995) 34.
    • (1995) Nucl. Instr. Meth. , vol.A367 , pp. 34
    • Oed, A.1
  • 7
    • 0028479864 scopus 로고
    • Aging studies with microstrip gas chambers
    • R. Bouclier et al, "Aging studies with microstrip gas chambers," Nucl. Instr. Meth., A348 (1994) 109.
    • (1994) Nucl. Instr. Meth. , vol.A348 , pp. 109
    • Bouclier, R.1
  • 8
    • 0030349964 scopus 로고    scopus 로고
    • Spark Damage Studies of Microgap Gas Chambers with Various Strip Metals
    • Anaheim, CA, November 5-7
    • H.S. Cho et al, "Spark Damage Studies of Microgap Gas Chambers with Various Strip Metals," Presented at the IEEE Nucl. Sci. Symp., Anaheim, CA, November 5-7, 1996.
    • (1996) IEEE Nucl. Sci. Symp.
    • Cho, H.S.1
  • 9
    • 0030172705 scopus 로고    scopus 로고
    • Microgap Gas Chamber Studies
    • H.S. Cho et al, "Microgap Gas Chamber Studies," IEEE Trans. Nuc. Sci., Vol. 43, No. 3 (1996) pp. 1227-1231.
    • (1996) IEEE Trans. Nuc. Sci. , vol.43 , Issue.3 , pp. 1227-1231
    • Cho, H.S.1
  • 10
    • 51249164205 scopus 로고
    • Electric field, avalanche growth and signal development in Micro-Strip Gas Chamber and Micro-Gap Chamber
    • INFN PI/AE-94/02
    • R. Bellazzini et al, "Electric field, avalanche growth and signal development in Micro-Strip Gas Chamber and Micro-Gap Chamber," INFN PI/AE-94/02, Submitted to La Rivista del Nuovo Cimento, 1994.
    • (1994) La Rivista del Nuovo Cimento
    • Bellazzini, R.1
  • 11
    • 0004170570 scopus 로고    scopus 로고
    • Ansoft Corporation. Credit also to S. Biagi for his help in getting us onto MAXWELL and in sending us his programs
    • Maxwell Electric Field Simulator, Ansoft Corporation. Credit also to S. Biagi for his help in getting us onto MAXWELL and in sending us his programs.
    • Maxwell Electric Field Simulator
  • 12
    • 33747731787 scopus 로고    scopus 로고
    • operated at 0.2mA (max.) and 4-30 kV. X-Tech is now owned by Oxford Instruments, Scotts Vally, CA 95066, USA
    • X-ray technologies, Inc. (X-tech), X-tech Tube Model 1303AC-01B, operated at 0.2mA (max.) and 4-30 kV. X-Tech is now owned by Oxford Instruments, Scotts Vally, CA 95066, USA.
    • X-tech Tube Model 1303AC-01B
  • 13
    • 0010059252 scopus 로고
    • Effects of Freons on Wire Chamber Aging
    • J. Wise et al, "Effects of Freons on Wire Chamber Aging," Nucl. Instr. Meth., A297 (1990) 169.
    • (1990) Nucl. Instr. Meth. , vol.A297 , pp. 169
    • Wise, J.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.