Investigation of walk-out phenomena in SiC mesa diodes with SiO2/Si3N4 passivation

Diamond and Related Materials

Volumn 6, Issue 10, 1997, Pages 1476-1479

  Ovuka, Zoran ^a   Bakowski, Mietek ^a  

^a ACREO AB   (Sweden)

Author keywords

Drift; Mesa diodes; Oxide passivation; Walk out

Indexed keywords

EID: 0042728271     PISSN: 09259635     EISSN: None     Source Type: Journal    
DOI: 10.1016/s0925-9635(97)00075-7     Document Type: Article

References (7)

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