Preparation and characterization of copper telluride thin films by modified chemical bath deposition (M-CBD) method

Applied Surface Science

Volumn 218, Issue 1-4, 2003, Pages 291-297

  Pathan, H M ^a   Lokhande, C D ^a   Amalnerkar, D P ^b   Seth, T ^b  

^a SHIVAJI UNIVERSITY   (India)

^b CENTRE FOR MATERIALS FOR ELECTRONICS TECHNOLOGY C MET   (India)

Author keywords

Copper telluride; Modified chemical method; Synthesis and properties

Indexed keywords

COPPER COMPOUNDS; ELECTRIC CONDUCTIVITY; ENERGY DISPERSIVE SPECTROSCOPY; LIGHT ABSORPTION; PHOTODETECTORS; RUTHERFORD BACKSCATTERING SPECTROSCOPY; SCANNING ELECTRON MICROSCOPY; SOLAR CELLS; X RAY DIFFRACTION ANALYSIS;

CHEMICAL BATH;

THIN FILMS;

EID: 0042694710     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0169-4332(03)00623-8     Document Type: Article

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