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Volumn 41, Issue 9 A/B, 2002, Pages

Correlation between film thickness and critical current density of Sm1+xBa2-x Cu3O6+δ films deposited by pulsed laser deposition

Author keywords

Critical current density; Film thickness; PLD; Sm1+xBa2 xCu3O6+ film; Surface morphology

Indexed keywords

CRITICAL CURRENT DENSITY (SUPERCONDUCTIVITY); DEPOSITION; MAGNESIA; PRECIPITATION (CHEMICAL); PULSED LASER DEPOSITION; SURFACES;

FILM THICKNESS;

SEMICONDUCTING SAMARIUM COMPOUNDS;

EID: 0037107050 PISSN: 00214922 EISSN: None Source Type: Journal
DOI: 10.1143/jjap.41.l983 Document Type: Article

Times cited : (16)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.