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An analysis of the reflectivity of a three-layer dielectric stack is given in M. Born and E. Wolf, Principles of Optics (Pergamon, Oxford, 1970), pp. 71-66.
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85033033445
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note
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In previous work (see Ref. 8), we have established that an "anneal" of samples (without oxidation) does not produce changes in either the TRPL lifetime or PL intensities of InAlP/InGaP DH structures. We expect similar results for the samples of this work.
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