The measurement of the tip current noise as a method to characterize the exposed area of coated ESTM tips

IEEE Transactions on Instrumentation and Measurement

Volumn 52, Issue 3, 2003, Pages 859-864

  Abadal, Gabriel ^a   Pérez Murano, Francesc ^a   Barniol, Nuria ^a   Aymerich, X ^a  

^a UNIVERSITAT AUTÒNOMA DE BARCELONA   (Spain)

Author keywords

Current noise; Electrochemical scanning tunneling microscopy; Electrochemical scanning tunneling microscopy (ESTM) tip coating; Exposed tip area; Nanotechnology; Scanning probe microscopy; Ultramicroelectrodes

Indexed keywords

COATING TECHNIQUES; CYCLIC VOLTAMMETRY; ELECTRIC CURRENTS; ELECTRIC POTENTIAL; ELECTROCHEMISTRY; ELECTROLYTES; MATHEMATICAL MODELS; MICROELECTRODES; NANOTECHNOLOGY; SCANNING TUNNELING MICROSCOPY;

ULTRAMICROELECTRODES;

SPURIOUS SIGNAL NOISE;

EID: 0042592980     PISSN: 00189456     EISSN: None     Source Type: Journal    
DOI: 10.1109/TIM.2003.814683     Document Type: Article

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