A nonoptical shear-force method for tip-sample distance regulation

Guangzi Xuebao/Acta Photonica Sinica

Volumn 28, Issue 2, 1999, Pages 120-123

  Bai, Yonglin ^a   Zhang, Gongli ^a   Ren, Kehui ^b   White, J D ^b   Hou, Xun ^a,b  

^a NORTHWEST UNIVERSITY   (China)

^b XI AN INSTITUTE OF OPTICS AND PRECISION MECHANICS   (China)

Author keywords

Microscopy; Near field scanning optical; Pizoelectric ceramic; Probe sample separation; Shear force

Indexed keywords

EID: 0042567251     PISSN: 10044213     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

References (10)

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