Surface studies by grazing-exit electron probe microanalysis (GE-EPMA)

X-Ray Spectrometry

Volumn 30, Issue 2, 2001, Pages 123-126

  Tsuji, K ^a   Murakami, Y ^a   Wagatsuma, K ^a   Love, G ^b  

^a TOHOKU UNIVERSITY   (Japan)

^b University of Bath   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

CHROMIUM COMPOUNDS; COBALT; COBALT COMPOUNDS; PASSIVATION; PROBES; SILICON WAFERS; STEPPING MOTORS; SURFACE ANALYSIS; X RAY DETECTORS;

ANALYTICAL METHOD; CHARACTERISTIC X RAYS; ELECTRON PROBE MICROANALYSES; ELECTRON-PROBE MICROANALYSIS; EXIT ANGLES; GRAZING EXIT; MULTICHANNEL ANALYZERS; NEAR SURFACE REGIONS; SURFACE STUDY; TAKE-OFF ANGLE;

ELECTRON PROBE MICROANALYSIS;

EID: 0035612174     PISSN: 00498246     EISSN: None     Source Type: Journal    
DOI: 10.1002/xrs.480     Document Type: Article

References (10)

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