Stochastic response surface method and tolerance analysis in microelectronics

COMPEL - The International Journal for Computation and Mathematics in Electrical and Electronic Engineering

Volumn 22, Issue 2, 2003, Pages 314-327

  Anile, Angelo Marcello ^a   Spinella, Salvatore ^a   Rinaudo, Salvatore ^b  

^a UNIVERSITY OF CATANIA   (Italy)

^b STMICROELECTRONICS   (Italy)

Author keywords

Fault tolerance; Microelectronics; Stochastic modelling

Indexed keywords

COMPUTER AIDED DESIGN; COMPUTER SIMULATION; FAULT TOLERANT COMPUTER SYSTEMS; INTEGRATED CIRCUIT LAYOUT; MATHEMATICAL MODELS; RANDOM PROCESSES; STATISTICAL METHODS;

STOCHASTIC MODELLING; STOCHASTIC RESPONSE SURFACE METHOD; TOLERANCE ANALYSIS;

MICROELECTRONICS;

EID: 0042522547     PISSN: 03321649     EISSN: None     Source Type: Journal    
DOI: 10.1108/03321640310459234     Document Type: Article

References (12)

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