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Volumn 36, Issue 16, 2003, Pages 5905-5907
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Paracrystalline lattice distortion in the near-surface region of melt-crystallized polyethylene films evaluated by synchrotron-sourced grazing-incidence X-ray diffraction
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Author keywords
[No Author keywords available]
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Indexed keywords
AGGLOMERATION;
ATOMIC FORCE MICROSCOPY;
CRYSTAL LATTICES;
CRYSTALLIZATION;
POLYETHYLENES;
TRANSMISSION ELECTRON MICROSCOPY;
X RAY DIFFRACTION ANALYSIS;
SOLID FILMS;
PLASTIC FILMS;
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EID: 0042476333
PISSN: 00249297
EISSN: None
Source Type: Journal
DOI: 10.1021/ma034526q Document Type: Article |
Times cited : (31)
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References (15)
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