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Volumn 36, Issue 16, 2003, Pages 5905-5907

Paracrystalline lattice distortion in the near-surface region of melt-crystallized polyethylene films evaluated by synchrotron-sourced grazing-incidence X-ray diffraction

Author keywords

[No Author keywords available]

Indexed keywords

AGGLOMERATION; ATOMIC FORCE MICROSCOPY; CRYSTAL LATTICES; CRYSTALLIZATION; POLYETHYLENES; TRANSMISSION ELECTRON MICROSCOPY; X RAY DIFFRACTION ANALYSIS;

EID: 0042476333     PISSN: 00249297     EISSN: None     Source Type: Journal    
DOI: 10.1021/ma034526q     Document Type: Article
Times cited : (31)

References (15)
  • 13
    • 0346611600 scopus 로고
    • Hosemann, R. Z. Phys. 1950, 128, 1-35, 465-492.
    • (1950) Z. Phys. , vol.128 , pp. 1-35
    • Hosemann, R.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.