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Volumn 40, Issue 2, 2000, Pages 336-343

Surface structure of isotactic polypropylene by X-ray diffraction

Author keywords

[No Author keywords available]

Indexed keywords

ANNEALING; COMPRESSION MOLDING; CRYSTAL DEFECTS; CRYSTAL GROWTH; CRYSTAL STRUCTURE; OXIDATION; QUENCHING; RESIDUAL STRESSES; SURFACE STRUCTURE; TEMPERATURE; X RAY DIFFRACTION ANALYSIS;

EID: 0034139963     PISSN: 00323888     EISSN: None     Source Type: Journal    
DOI: 10.1002/pen.11167     Document Type: Article
Times cited : (64)

References (37)
  • 4
    • 0003025966 scopus 로고
    • NEXAFS spectroscopy
    • Springer, Berlin, Heidelberg, New York
    • J. Stohr, NEXAFS Spectroscopy, Springer Series in Surface Science, vol. 25, Springer, Berlin, Heidelberg, New York (1992).
    • (1992) Springer Series in Surface Science , vol.25
    • Stohr, J.1
  • 11
    • 0027590056 scopus 로고
    • B. J. Factor, T. P. Russell, and M. F. Toney, Phys. Rev. Lett., 66, 1181 (1991); Macromolecules, 26, 2847 (1993).
    • (1993) Macromolecules , vol.26 , pp. 2847
  • 26
    • 0015159137 scopus 로고
    • K. Hara and H. Schonhorn, J. Appl. Phys., 42, 4549 (1971); H. Schonhorn and L. H. Sharpe, J. Polym. Sci., Polym. Lett. Ed., B3, 235 (1965).
    • (1971) J. Appl. Phys. , vol.42 , pp. 4549
    • Hara, K.1    Schonhorn, H.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.