Investigations on cluster and molecular ion formation by plasma mass spectrometry

Fresenius' Journal of Analytical Chemistry

Volumn 359, Issue 4-5, 1997, Pages 338-345

  Becker, J S ^a   Dietze, H J ^a  

^a FORSCHUNGSZENTRUM JÜLICH   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0042454833     PISSN: 09370633     EISSN: None     Source Type: Journal    
DOI: 10.1007/s002160050583     Document Type: Article

References (41)

1. Dietze H-J (1975) Massenspektrometrische Spurenanalyse. Akademische Verlagsgesellschaft Geest & Portig, Leipzig
2. Harrison HW (1988) In: Inorganic Mass Spectrometry. Adams F, Gijbels R, Van Grieken R (eds) Chemical Analysis 95: 85-123
3. Dietze H-J, Becker JS (1993) In: Laser Ionization Mass Analysis. Vertes A, Gijbels R, Adams F (eds) Chemical Analysis 124: 453-504
4. Hieftje GM (1996) J Anal At Spectrom 11:613-621
5. Raith A, Godfrey J, Hutton RC (1996) Fresenius J Anal Chem 354:163-168
6. Marie Y, Gao Y, Migneon HN (1995) Surface and Interface Analysis 23:38-43
7. Gnaser H (1994) J Vac Sci Techn 12:452-456
8. Märk TD, Castleman Jr AW (1985) Adv At Mol Phys 28:65
9. Martin TP (1986) Angew Chem 98:197-212
10. Märk TD (1995) Adv Mass Spectrom 13:71-94
11. Haberland H (ed)(1994) Clusters of Atoms and Molecules. Springer, Berlin Heidelberg New York
12. Martin TP, Bergmann T, Näher U, Schaber H, Zimmermann U (1994) Nucl Instrum Methods B88:1
13. Hilpert K, Miller M (1994) J Electrochem Soc 141:2769-2772
14. Rohlfing EA, Cox DM, Kaldor A (1984) J Chem Phys 81:3322
15. Echt O, Kreisle D, Knapp M, Recknagel E (1982) Chem Phys Lett 91:413
16. Sattler K, Mühlbach J, Recknagel E (1980) Phys Rev Letters 45:821
17. Betz G, Kirchner R, Nicolussi, Husindky W (1994) Secondary Ion Mass Spectrometry IX (Proceedings of the Ninth International Conference on SIMS, Yokohama, 7-12 November 1993) Wiley, pp 57-63
18. Becker JS, Dietze H-J (1995) J Anal At Spectrom 10:637-641
19. Becker JS, Seifert G, Saprykin AI, Dietze H-J (1996) J Anal At Spectrom 11:643-648
20. Gijbels R, Van Straaten M, Bogaerts A (1995) Advances in Mass Spectrometry 13: 241-256
21. Kroto HW, Heath JR, O'Prien SC, Curl RF, Smalley RG (1985) Nature 318:162
22. Dietze H-J, Becker JS, Opauszky I, Matus L, Nyary I, Frecska J (1983 III) Mikrochim Acta, pp 263-270
23. Jäger R, Saprykin AI, Becker JS, Dietze H-J, Broekaert JAC (1997) Mikrochim Acta 125: 41-44
24. Franzen J, Hintenberger H (1961) Z Naturforschg 16A:535
25. Fürstenau N, Hillenkamp F, Nitsche R (1979) Int J Mass Spectrom Ion Proc 31:85
26. Seifert G, Becker JS, Dietze H-J (1988) Int J Mass Spectrom Ion Proc 84:121-133
27. Dietze H-J, Becker JS (1987) ZfI-Mitteilungen 134: 65-85
28. Becker JS, Dietze H-J (1986) Int J Mass Spectrom Ion Proc 73:157-166
29. Seifert G, Schwab B, Becker JS, Dietze H-J (1988) Int J Mass Spectrom Ion Proc 85:327-338
30. Becker JS, Dietze H-J, Keßler G, Bauer H-D, Pompe W (1990) Z Phys B 81:47-51
31. Martin TP (1984) Ber Bunsenges Phys Chem 88:300
32. Becker JS, Dietze H-J (1983) Int J Mass Spectrom Ion Proc 51:325-345
33. Becker JS, Dietze H-J (1988) Int J Mass Spectrom Ion Proc 82:287-298
34. Gupta SK, Gingerich KA (1979) J Chem Phys 71, 3072
35. (1980) J Chem Phys 72:2795
36. Ayuela A, Seifert G, Schmidt R (1996) Z Phys D (submitted)
37. Becker JS, Dietze H-J (1985) Int J Mass Spectrom Ion Proc 67: 57-65
38. Michiels E, Gijbels R (1984) Anal Chem 56:1115
39. Bauschlicher Jr C, Partridge H, Langhoff SR (1990) Chem Phys Lett 165:272-276
40. Barshik CM, Smith DH, Johnson E, King FL, Bastug T, Flicke B (1995) Appl Spectrosc 49:885-889
41. Kennis P (1996) Solid Mass Spectrometry Techniques Based on Sputtering with Emphasis on Glow Discharge Mass Spectrometry, PhD Thesis, Universitaire Instelling Antwerpen