Palladium clusters formed on the complex pseudo-10-fold surface of the ξ ′-Al77.5Pd19Mn3.5 approximant crystal

Surface Science

Volumn 541, Issue 1-3, 2003, Pages 147-159

  Fournee V ^a   Barrow, J A ^b,c   Shimoda, M ^d   Ross, A R ^c,e   Lograsso, T A ^c,e   Thiel, P A ^b,c   Tsai, A P ^d  

^a CNRS   (France)

^b IOWA STATE UNIVERSITY   (United States)

^c IOWA STATE UNIVERSITY   (United States)

^d NATIONAL INSTITUTE FOR MATERIALS SCIENCE   (Japan)

^e NONE   (United States)

Author keywords

Alloys; Epitaxy; Metallic surfaces; Palladium; Photoelectron spectroscopy; Scanning tunneling microscopy

Indexed keywords

CRYSTAL GROWTH; ELECTRON ENERGY LEVELS; PALLADIUM; PHOTOEMISSION; QUASICRYSTALS; SPECTROSCOPIC ANALYSIS; THIN FILMS;

METALLIC SURFACES;

SURFACE REACTIONS;

EID: 0042443450     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0039-6028(03)00781-7     Document Type: Article

References (46)

1. Shechtman D., Blech I., Gratias D., Cahn J.W. Phys. Rev. Lett. 53:1984;1951.
2. Tsai A.P. MRS Bull. 22:1997;43.
3. Tsai A.P. Stadnik Z.M. Physical Properties of Quasicrystals. 1999;5 Springer, Berlin.
4. Stadnik Z.M. Physical Properties of Quasicrystals. 1999;Springer.
5. Dubois J.-M. J. Phys.: Condens. Matter. 13:2001;7753.
6. T. Masumoto, A. Inoue, YKK Corporation, Honda Giken Kogyo Kabushiki Kaisha, European Patent No. 94115137.5, 1994.
7. M. Yoshimura, A.-p. Tsai, Y. Takahashi, Eur. Pat. Appl. (Japan as Represented by Director General of Ministry of Education, Culture, Sports, Science and Technology N.R.I. for Metals, Japan), Ep, 2001, p. 8.
8. Tsai A.P., Yoshimura M. Appl. Catal. A. 214:2001;237.
9. Yoshimura M., Tsai A.P. J. Alloys Compd. 342:2002;451.
10. Somorjai G.A. Introduction to Surface Chemistry and Catalysis. 1994;Wiley, New York.
11. Campbell C.T. Surf. Sci. Rep. 27:1997;1.
12. Henry C.R. Surf. Sci. Rep. 31:1998;235.
13. Bäumer M., Freund H.-J. Prog. Surf. Sci. 61:1999;127.
14. Valden M., Lai X., Goodman D.W. Science. 281:1998;1647.
15. Janot C. Quasicrystals: A Primer. second ed. 1995;Oxford Science Publications, Oxford.
16. Boudard M., Klein H., de Boissieu M., Audier M. Philos. Mag. A. 74:1996;939.
17. Jablonski A., Powell C.J. Surf. Sci. Rep. 47:2002;33.
18. Fournee V., Ross A.R., Lograsso T.A., Evans J.W., Thiel P.A. Surf. Sci. 537:2003;5.
19. Fournee V., Cai T., Ross A.R., Lograsso T.A., Anderegg J.W., Dong C., Kramer M., Fisher I.R., Canfield P.C., Thiel P.A. Phys. Rev. B. 66:2002;165423.
20. Stempel S., Bäumer M., Freund H.-J. Surf. Sci. 402-404:1998;424.
21. Piednoir A., Perrot E., Granjeaud S., Humbert A., Chapon C., Henry C.R. Surf. Sci. 391:1997;19.
22. Steltenpohl A., Memmel N. Surf. Sci. 402-404:1998;277.
23. Steltenpohl A., Memmel N. Surf. Sci. 454-456:2000;558.
24. Bréchignac C., Cahuzac P., Carlier F., Colliex C., de Frutos M., Kebaïli M., Le Roux J., Masson A., Yoon B. Eur. Phys. J. D. 16:2001;265.
25. Bartelt N.C., Evans J.W. Phys. Rev. B. 54:1996;R17359.
26. Venables J.A. Physica A. 239:1997;35.
27. Thiel P.A., Evans J.W. J. Phys. Chem. 104:2000;1663.
28. Venables J.A. Introduction to Surface and Thin Film Processes. 2001;Cambridge University Press.
29. Fournee V., Cai T., Ross A.R., Lograsso T.A., Evans J.W., Thiel P.A. Phys. Rev. B: Brief Rep. 67:2003;033406.
30. Esch S., Hohage M., Michely T., Comsa G. Phys. Rev. Lett. 72:1994;518.
31. Layson A.R., Thiel P.A. Surf. Sci. 472:2001;L151.
32. Layson A.R., Evans J.W., Fournée V., Thiel P.A. J. Chem. Phys. 118:2003;6467.
33. Steigerwald D.A., Jacobs I., Egelhoff J.W.F. Surf. Sci. 202:1988;472.
34. Bauer E., van der Merwe J.H. Phys. Rev. B. 33:1986;3657.
35. Vitos L., Ruban A.V., Skriver H.L., Kollar J. Surf. Sci. 411:1998;186.
36. Kern G., Hafner J. Phys. Rev. B. 58:1998;13167.
37. Merwe J.H.v.d. Prog. Surf. Sci. 67:2001;365.
38. D. Naumovic, P. Aebi, M. Bovet, F. Clerc, C. Koitzsch, L. Schlapbach, C. Beeli, K. Kunze, T.A. Lograsso, A.R. Ross, D.W. Delaney, in: Eighth International Conference on Quasicrystals, J. Non-Cryst. Solids (2004), in press.
39. Naumovic D., Aebi P., Schlapbach L., Beeli C., Lograsso T.A., Delaney D.W. Phys. Rev. B. 60:1999;R16330.
40. Neuhold G., Barman S.R., Horn K., Theis W., Ebert P., Urban K. Phys. Rev. B. 58:1998;734.
41. Fournée V., Belin-Ferré E., Pêcheur P., Tobola J., Dankhazi Z., Sadoc A., Müller H. J. Phys.: Condens. Matter. 14:2002;87.
42. Fuggle J.C., Kaellne E., Watson L.M., Fabian D.J. Phys. Rev. B. 16:1977;750.
43. Rodriguez J.A. Surf. Sci. Rep. 24:1996;223.
44. Shen Z., Stoldt C.R., Jenks C.J., Lograsso T.A., Thiel P.A. Phys. Rev. B. 60:1999;14688.
45. Ledieu J., McGrath R., Diehl R.D., Lograsso T.A., Delaney D.W., Papadopolos Z., Kasner G. Surf. Sci. Lett. 492:2001;L729.
46. Papadopolos Z., Kasner G., Ledieu J., Cox E.J., Richardson N.V., Chen Q., Diehl R.D., Lograsso T.A., Ross A.R., McGrath R. Phys. Rev. B. 66:2002;184207.