Reliability and thermal performance of IGBT plastic modules for the more electric aircraft

IEEE International Symposium on Power Semiconductor Devices and ICs (ISPSD)

Volumn , Issue , 2003, Pages 118-121

  Newcombe, D R ^a   Coulbeck, L ^a   Dessiatoun, S ^b   Ivakhnenko, I ^b   Sawata, T ^c   Holme, M G ^c  

^a DYNEX SEMICONDUCTOR LTD   (United Kingdom)

^b Rinc Inc   (United States)

^c Goodrich Power Systems   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

AIRCRAFT; COSMIC RAYS; COSTS; HEAT SINKS;

MORE ELECTRIC AIRCRAFT (MEA);

INSULATED GATE BIPOLAR TRANSISTORS;

EID: 0042440630     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (6)

1. Vos et Al. Irradiation Experiments with High Voltages Power Devices a possible means to predict Failure Rates due to cosmic rays. ISPSD 1997 p 169-172
2. IBM Journal of Research and Development, vol. 40
3. H.R.Zeller. Cosmic Ray Induced Failures in High Power Semiconductor Devices. Solid State Electronics, 1995, Vol. 38, No. 12, p. 2041-2046
4. H.R.Zeller. Cosmic Ray Induced Failures in High Power Semiconductor Devices. Microelectronics Reliability, Vol. 37, No 10/11, p 1711-1718, 1997
5. Zhuhauskas. Heat transfer from tubes in cross flow. T.F.Irvine, J.P. Hartnett,Eds. Advances in heat transfer, vol 8, Academic Press, NY, 1972
6. Dr Jurgen Schulz-Harder. DCB substrates as a base for Power MCM,s