메뉴 건너뛰기




Volumn 9, Issue 4, 2003, Pages 333-344

Adhesion of cleaned nanoscopic metal contacts

Author keywords

Adhesion; AFM; Atomic force microscope; Friction; Nanoscopic metal contacts; Theoretical models

Indexed keywords

ATOMIC FORCE MICROSCOPY; COMPUTER SIMULATION; FRICTION; IMPURITIES; LUBRICANTS; MOLECULAR DYNAMICS; ULTRAHIGH VACUUM;

EID: 0042347612     PISSN: 13544063     EISSN: None     Source Type: Journal    
DOI: 10.1002/tt.3020090405     Document Type: Article
Times cited : (2)

References (27)
  • 1
    • 0024647894 scopus 로고
    • Tribology of polymers
    • Santner, E., and Czichos, H., 'Tribology of polymers', Trib. Int., 22 (1989) 103-9.
    • (1989) Trib. Int. , vol.22 , pp. 103-109
    • Santner, E.1    Czichos, H.2
  • 2
    • 0031618568 scopus 로고    scopus 로고
    • Microtribological behavior of Au(001) studied by AFM/FFM
    • Polaczyk, C., Schneider, T., Schöfer, J., and Santner, E., 'Microtribological behavior of Au(001) studied by AFM/FFM', Surf. Sci., 402-404 (1998) 454-8.
    • (1998) Surf. Sci. , vol.402-404 , pp. 454-458
    • Polaczyk, C.1    Schneider, T.2    Schöfer, J.3    Santner, E.4
  • 5
    • 0030156294 scopus 로고    scopus 로고
    • Variation of the interfacial shear strength and adhesion of a nanometer-sized contact
    • Carpick, R.W., Agrait, N., Ogletree, D.F., and Salmeron, M., 'Variation of the interfacial shear strength and adhesion of a nanometer-sized contact', Langmuir, 12 (1996) 3333-40.
    • (1996) Langmuir , vol.12 , pp. 3333-3340
    • Carpick, R.W.1    Agrait, N.2    Ogletree, D.F.3    Salmeron, M.4
  • 7
    • 0011724503 scopus 로고    scopus 로고
    • Microscopic stick-slip in friction microscopy
    • Meurk, A., 'Microscopic stick-slip in friction microscopy', Trib. Lett., 8 (2000) 161-9.
    • (2000) Trib. Lett. , vol.8 , pp. 161-169
    • Meurk, A.1
  • 8
    • 0027662927 scopus 로고
    • Recent advances in molecular level understanding of adhesion, friction and lubrication
    • Yoshizawa, H., Chen, Y.-L., and Israelachvili, J., 'Recent advances in molecular level understanding of adhesion, friction and lubrication', Wear, 163 (1993) 161-6.
    • (1993) Wear , vol.163 , pp. 161-166
    • Yoshizawa, H.1    Chen, Y.-L.2    Israelachvili, J.3
  • 10
    • 0033558810 scopus 로고    scopus 로고
    • A general equation for fitting area and friction vs load measurements
    • Carpick, R.W., Ogletree, D.F., and Salmeron, M., 'A general equation for fitting area and friction vs load measurements', J. Collid Interf. Sci., 211 (1999) 395-400.
    • (1999) J. Collid Interf. Sci. , vol.211 , pp. 395-400
    • Carpick, R.W.1    Ogletree, D.F.2    Salmeron, M.3
  • 11
    • 0042597730 scopus 로고
    • Friction of dry solids in vacua
    • Shaw, P.E., and Leavey, E.W.L., 'Friction of dry solids in vacua', Phil. Mag., 10 (1930) 809-22.
    • (1930) Phil. Mag. , vol.10 , pp. 809-822
    • Shaw, P.E.1    Leavey, E.W.L.2
  • 14
    • 0042096621 scopus 로고
    • Mechanism of friction
    • Walton, D., 'Mechanism of Friction', J. Appl. Phys., 33 (1962) 519-25.
    • (1962) J. Appl. Phys. , vol.33 , pp. 519-525
    • Walton, D.1
  • 15
    • 0006612418 scopus 로고
    • The adhesion of metals and factors that influence it
    • Sikorski, M.E., 'The adhesion of metals and factors that influence it', Wear, 7 (1964) 144-62.
    • (1964) Wear , vol.7 , pp. 144-162
    • Sikorski, M.E.1
  • 16
    • 0000852639 scopus 로고
    • Adhesion between solid metals
    • Keller, D.V., 'Adhesion between solid metals', Wear, 6 (1963) 353-65.
    • (1963) Wear , vol.6 , pp. 353-365
    • Keller, D.V.1
  • 18
    • 0042096614 scopus 로고
    • Adhäsion, reibung und verschleiß von kobalt und kobaltlegierungen
    • Buckley, D.H., 'Adhäsion, Reibung und Verschleiß von Kobalt und Kobaltlegierungen', Kobalt, 38 (1968) 17-24.
    • (1968) Kobalt , vol.38 , pp. 17-24
    • Buckley, D.H.1
  • 19
    • 0014855457 scopus 로고
    • Der einfluss der gegenseitigen löslichkeit von metallen auf einige ihrer tribologischen eigenschaften
    • Habig, K.-H., 'Der Einfluss der gegenseitigen Löslichkeit von Metallen auf einige ihrer tribologischen Eigenschaften', Metalloberfläche, 24 (1970) 375-9.
    • (1970) Metalloberfläche , vol.24 , pp. 375-379
    • Habig, K.-H.1
  • 20
    • 0000006242 scopus 로고
    • Scanning tunneling microscopy
    • Binnig, G., and Rohrer, H., 'Scanning tunneling microscopy', Helv. Phys. Acta, 55 (1982) 726; Gerber, Ch., and Weibel, E., Phys. Rev. Lett., 49 (1982) 57; idem, Phys. Rev. Lett., 50 (1983) 120.
    • (1982) Helv. Phys. Acta , vol.55 , pp. 726
    • Binnig, G.1    Rohrer, H.2
  • 21
    • 25544466851 scopus 로고
    • Binnig, G., and Rohrer, H., 'Scanning tunneling microscopy', Helv. Phys. Acta, 55 (1982) 726; Gerber, Ch., and Weibel, E., Phys. Rev. Lett., 49 (1982) 57; idem, Phys. Rev. Lett., 50 (1983) 120.
    • (1982) Phys. Rev. Lett. , vol.49 , pp. 57
    • Gerber, Ch.1    Weibel, E.2
  • 22
    • 19044362545 scopus 로고
    • Binnig, G., and Rohrer, H., 'Scanning tunneling microscopy', Helv. Phys. Acta, 55 (1982) 726; Gerber, Ch., and Weibel, E., Phys. Rev. Lett., 49 (1982) 57; idem, Phys. Rev. Lett., 50 (1983) 120.
    • (1983) Phys. Rev. Lett. , vol.50 , pp. 120
    • Gerber, Ch.1    Weibel, E.2
  • 24
    • 0343681011 scopus 로고
    • Atomic-scale friction of a tungsten tip on a graphite surface
    • Mate, C.M., McClelland, G.M., Erlandsson, R., and Chiang, S., 'Atomic-scale friction of a tungsten tip on a graphite surface', Phys. Rev. Lett., 59 (1987) 1942-5.
    • (1987) Phys. Rev. Lett. , vol.59 , pp. 1942-1945
    • Mate, C.M.1    McClelland, G.M.2    Erlandsson, R.3    Chiang, S.4
  • 26
    • 0033729041 scopus 로고    scopus 로고
    • Studying surface glass-to-rubber transition using atomic force microscopic adhesion measurements
    • Tsui, O.K.C., Wang, X.P., Ho, J.Y.L., Ng, T.K., and Xiao, X., 'Studying surface glass-to-rubber transition using atomic force microscopic adhesion measurements', Macromolecules, 33 (2000) 4198-204.
    • (2000) Macromolecules , vol.33 , pp. 4198-4204
    • Tsui, O.K.C.1    Wang, X.P.2    Ho, J.Y.L.3    Ng, T.K.4    Xiao, X.5


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.